Description: The proposed research targets the development of a Remote X-ray Analyzer (ReXA) using X-ray fluorescence (XRF) for geochemical analysis of planetary surface materials, to be fitted to rovers or landers. The instrument differentiates from current state-of-the-art planetary XRF spectrometers in that it will not rely on a robotic arm or other deployment mechanisms. Instead of being brought in contact with or in close proximity to the surface to be analyzed, it will operate from a sufficient distance to ensure safe ground clearance as a stationary system mounted inside the host platform, or hanging from its underside. This instrument will be particularly pertinent when fitted to a small rover lacking the robotic arm necessary for deploying a contact instrument. This development targets space deployment in a short time frame following the SBIR completion, so we will focus our development on individual technologies already at high TRL, or that can be brought to TRL4-5 within the SBIR. ReXA will allow geochemical analysis of ground surface with no mechanism while ensuring a safe ground clearance to the platform.

Benefits: This development will find NASA applications in landed missions to Mars, the Moon, Mercury, Small Bodies and in general any airless or low pressure atmosphere rocky or icy body. Derivative NASA applications would be as a material characterization instrument in an orbital laboratory on-board the ISS, or high performance small sized micro XRF instruments on Earth, for planetary analog field research, or as part of a remote analytical facility for confined samples inside a sample-curation glove-box, for instance for Mars Sample Return.

The proposed development will open new opportunities for the company to develop products for XRF and micro-XRF analyses, and enabling new generations of element mapping instruments for cultural heritage and industrial applications. The proposed work on quantitative analysis methods will directly apply to the current products marketed by the company (XRD/XRF, microXRF, ...)